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<journal-id journal-id-type="publisher">global-journal-of-research-in-engineering-f-electrical-electronic</journal-id>
<journal-title-group>
<journal-title>Global Journal of Research in Engineering - F: Electrical &amp; Electronic</journal-title>
</journal-title-group>
<issn publication-format="print">0975-5861</issn>
<issn publication-format="electronic">2249-4596</issn>
<publisher><publisher-name>Global Journals Publishing Group Incorporated</publisher-name></publisher>
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<article-id pub-id-type="publisher-id">89718</article-id>
<title-group>
<article-title>Investigating a Hypothetical Semiconductor Laser Bar with a Smile-shaped Temperature Profile Using a Laser Diode Simulation/Emulation Tool</article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author"><name><surname>Amuzuvi</surname><given-names>Christian Kwaku</given-names></name><xref ref-type="aff" rid="aff1" />
</contrib>
</contrib-group>
<aff id="aff1">GHANA, University of Nottingham (UNott), Nottingham, NG7 2RD, U.K.</aff>
<pub-date publication-format="electronic" date-type="pub" iso-8601-date="2013-01-15">
<day>15</day>
<month>01</month>
<year>2013</year>
</pub-date>
<volume>13</volume>
<issue>F16</issue>
<fpage>1</fpage>
<lpage>5</lpage>
<abstract><p>In this paper, Barlase, a semiconductor laser diode emulation tool, is used to emulate the by-emitter degradation analysis of high power semiconductor laser diodes. Barlase is a software that uses a LabView control interface. We have already demonstrated how Barlaseworks using a hypothetical laser diode bar (multiple emitters) to validate the usefulness of the tool. It should however, be noted that, this scenario is valid for devices at the start of the aging process only. This scenario was investigated to demonstrate Barlase as follows: curved temperature (smile) profile with maximum temperature at the centre of the bar. The result of this simulation scenario shows the successful implementation of Barlase in the by-emitter analysis of laser diodes.</p></abstract>
<kwd-group kwd-group-type="author-generated">
<kwd>by-emitter</kwd>
<kwd>emitter</kwd>
<kwd>defect</kwd>
<kwd>smile-shaped temperature profile</kwd>
<kwd>emitter power</kwd>
<kwd>quantum well</kwd>
<kwd>degradation</kwd>
<kwd>threshold current</kwd>
<kwd>slope efficiency</kwd>
<kwd>band gap</kwd>
</kwd-group>
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<title>Full Text</title>
<p>In this paper, Barlase, a semiconductor laser diode emulation tool, is used to emulate the by-emitter degradation analysis of high power semiconductor laser diodes. Barlase is a software that uses a LabView control interface. We have already demonstrated how Barlaseworks using a hypothetical laser diode bar (multiple emitters) to validate the usefulness of the tool. It should however, be noted that, this scenario is valid for devices at the start of the aging process only. This scenario was investigated to demonstrate Barlase as follows: curved temperature (smile) profile with maximum temperature at the centre of the bar. The result of this simulation scenario shows the successful implementation of Barlase in the by-emitter analysis of laser diodes.</p>
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