Investigating a Hypothetical Semiconductor Laser Bar with a Smile-shaped Temperature Profile Using a Laser Diode Simulation/Emulation Tool

Investigating a Hypothetical Semiconductor Laser Bar with a Smile-shaped Temperature Profile Using a Laser Diode Simulation/Emulation Tool

Article ID

30BY2

Investigating a Hypothetical Semiconductor Laser Bar with a Smile-shaped Temperature Profile Using a Laser Diode Simulation/Emulation Tool

Christian Kwaku Amuzuvi University of Mines and Technology

Joseph Cudjoe Attachie

DOI

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Abstract

In this paper, Barlase, a semiconductor laser diode emulation tool, is used to emulate the by-emitter degradation analysis of high power semiconductor laser diodes. Barlase is a software that uses a LabView control interface. We have already demonstrated how Barlaseworks using a hypothetical laser diode bar (multiple emitters) to validate the usefulness of the tool. It should however, be noted that, this scenario is valid for devices at the start of the aging process only. This scenario was investigated to demonstrate Barlase as follows: curved temperature (smile) profile with maximum temperature at the centre of the bar. The result of this simulation scenario shows the successful implementation of Barlase in the by-emitter analysis of laser diodes.

Investigating a Hypothetical Semiconductor Laser Bar with a Smile-shaped Temperature Profile Using a Laser Diode Simulation/Emulation Tool

Authors

Christian Kwaku Amuzuvi University of Mines and Technology

Joseph Cudjoe Attachie

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How to Cite

Christian Kwaku Amuzuvi. 2014. “. Global Journal of Research in Engineering – F: Electrical & Electronic GJRE-F Volume 13 (GJRE Volume 13 Issue F16): .

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Journal Specifications

Crossref Journal DOI 10.17406/gjre

Print ISSN 0975-5861

e-ISSN 2249-4596

GJRE Volume 13 Issue F16
Pg. 1- 5

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Submission Received December 9, 2012
Accepted December 31, 2012
Published January 15, 2013

Keywords

band gap by-emitter defect Degradation emitter emitter power quantum well slope efficiency smile-shaped temperature profile threshold current

Article Matrices

Total Score: 102

Country: Ghana

Subject: Global Journal of Research in Engineering - F: Electrical & Electronic

Authors: Christian Kwaku Amuzuvi, Joseph Cudjoe Attachie (PhD/Dr. count: 0)

View Count (all-time): 169

Total Views (Real + Logic): 4716

Total Downloads (simulated): 2426

Publish Date: 2014 01, Fri

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Total Views: 4716

Total Downloads: 2426

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