An On-Chip Delay Measurement Technique for Small-Delay Defect Detection using Signature Registers

Rajeshwari Soma; Zulekha Tabassum; S.Prathap

An On-Chip Delay Measurement Technique for Small-Delay Defect Detection using Signature Registers

Rajeshwari Soma * §

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Zulekha Tabassum §

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S.Prathap §

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An On-Chip Delay Measurement Technique for Small-Delay Defect Detection using Signature Registers

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Abstract

This paper presents a delay measurement technique using signature analysis, and a scan design for the proposed delay measurement technique to detect small-delay defects. The proposed measurement technique measures the delay of the explicitly sensitized paths with the resolution of the on-chip variable clock Generator. The proposed scan design realizes complete on-chip delay measurement in short measurement time using the proposed delay measurement technique and extra latches for storing the test vectors. The evaluation with Rohm 0.18-m process shows that the measurement time is 67.8% reduced compared with that of the delay measurement with standard scan design on average. The area overhead is 23.4% larger than that of the delay measurement architecture using standard scan design, and the difference of the area overhead between enhanced scan design and the proposed method is 7.4% on average. The data volume is 2.2 times of that of test set for normal testing on average.

References

14 Cites in Article

Reference Format

1. N Ahmed,M Tehranipoor (2007). Nanometer Technology Designs: High Quality Delay Tests. Nanometer Technology Designs: High Quality Delay Tests
2. K Noguchi,K Nose,T Ono,M Mizuno (2008). A small-delay defect detection technique for dependable LSIs. Proc. IEEE Symp. VLSI Circuits, 64-65.
3. B Dervisoglu,G Stong (1991). DESIGN FOR TESTABILITY USING SCANPATH TECHNIQUES FOR PATH-DELAY TEST AND MEASUREMENT. 1991, Proceedings. International Test Conference, 365.
4. K Noguchi,K Nose,T Ono,M Mizuno An area reduction technique of self-testing FFs for small delay defects detection. The Inst. Electron., Inf. Commun. Eng. (IEICE), 2009-2016.
5. A Krstic,K.-T Chen (1998). Delay Fault Testing for VLSI Circuits. Delay Fault Testing for VLSI Circuits
6. J.-J Liou,L.-C Wang,K.-T Cheng (2002). Enhancing test efficiency for delay fault testing using multiple clocked schemes. Proc. Des. Autom. Conf. (DAC), 371-374.
7. H Yan,A Singh (2004). Evaluating the effectiveness of detecting delay defects in the slack interval: A simulation study. Proc. IEEE Int. Test Conf. (ITC), 242-251.
8. Jaekwang Lee,Edward Mccluskey (2008). Failing Frequency Signature Analysis. 2008 IEEE International Test Conference, 1-8.
9. R Tayade,J Abraham (2008). On-chip programmable capture for accurate path delay test and characterization. Proc. IEEE Int. Test Conf. (ITC), 148-159.
10. M Beck,O Barondeau,X Lin,R Press (2005). Logic design for on-chip test clock generationimplementation details and impact on delay test quality. Proc. IEEE Des., Autom. Test Eur. Conf. Exhib, 56-61.
11. Shunichi Kaeriyama,Mikihiro Kajita,Masayuki Mizuno (2007). A 1-to-2GHz 4-Phase On-Chip Clock Generator with Timing-Margin Test Capability. 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 174-594.
12. Tsung-Yeh Li,Shi-Yu Huang,Hsuan-Jung Hsu,Chao-Wen Tzeng,Chih-Tsun Huang,Jing-Jia Liou,Hsi-Pin Ma,Po-Chiun Huang,Jenn-Chyou Bor,Cheng-Wen Wu,Ching-Cheng Tien,Mike Wang (2010). AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects. 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, 340-348.
13. N Ahmed,M Tehranipoor (2009). A Novel Faster-Than-at-Speed Transition-Delay Test Method Considering IR-Drop Effects. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 28(10), 1573-1582.
14. Mahmut Yilmaz,Krishnendu Chakrabarty,Mohammad Tehranipoor (2008). Test-Pattern Grading and Pattern Selection for Small-Delay Defects. 26th IEEE VLSI Test Symposium (vts 2008), 233-239.

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Funding

No external funding was declared for this work.

Conflict of Interest

The authors declare no conflict of interest.

Ethical Approval

No ethics committee approval was required for this article type.

Data Availability

Not applicable for this article.

How to Cite This Article

Rajeshwari Soma, Zulekha Tabassum, S.Prathap. 2013. "An On-Chip Delay Measurement Technique for Small-Delay Defect Detection using Signature Registers". Global Journal of Computer Science and Technology - C: Software & Data Engineering GJCST-C Volume 13 (GJCST Volume 13 Issue C10).

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GJCST Volume 13 Issue C10

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Journal Specifications

Crossref Journal DOI 10.17406/gjcst

Print ISSN 0975-4350

e-ISSN 0975-4172

Keywords

delay estimation design for testability (DFT)integrated circuit measurements semiconductor device reliability signature register

Classification

GJCST-C Classification D.2.5

Submission ReceivedDecember 14, 2012
Peer Review Double Blind
Handling Editor
Accepted December 31, 2012
Published October 5, 2013

Version of record

v1.2

Issue date

October 5, 2013

Language

English

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Article Matrices

Total Score: 103

Country: India

Subject: Global Journal of Computer Science and Technology - C: Software & Data Engineering

Authors: Rajeshwari Soma, Zulekha Tabassum, S.Prathap (PhD/Dr. count: 0)

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