Detection of Microstructure of Roughness by Optical Method

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Dr. R. Daira
Dr. R. Daira
σ
V.Chalvedin
V.Chalvedin
α Physico Chemistry of Surfaces and interfaces Research Laboratory of Skikda (LRPCSI), Algeria.

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Detection of Microstructure of Roughness by Optical Method

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References

7 Cites in Article
  1. Catherine Wykes (1982). Use Of Electronic Speckle Pattern Interferometry (ESPI) In The Measurement Of Static And Dynamic Surface Displacements.
  2. D Lφfkberg (1993). Recent developements in video speckle interferometry.
  3. S Nakadate,T Yatagai,H Saito (1983). Computeraided speckle pattern interferometry.
  4. J Tong,D Zhang,H Li,L Li (1996). Study on inplane displacement measurement under impact loading using digital speckle pattern interferometry.
  5. Katherine Creath (1985). Phase-shifting speckle interferometry.
  6. S Nakadate,H Saito (1985). Fringe scanning speckle pattern interferometry.
  7. Jun-Ichi Kato,Ichirou Yamaguchi,Qi Ping (1993). Automatic deformation analysis by a TV speckle interferometer using a laser diode.

Funding

No external funding was declared for this work.

Conflict of Interest

The authors declare no conflict of interest.

Ethical Approval

No ethics committee approval was required for this article type.

Data Availability

Not applicable for this article.

How to Cite This Article

Dr. R. Daira. 2012. \u201cDetection of Microstructure of Roughness by Optical Method\u201d. Global Journal of Research in Engineering - C: Chemical Engineering GJRE-C Volume 12 (GJRE Volume 12 Issue C2): .

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Journal Specifications

Crossref Journal DOI 10.17406/gjre

Print ISSN 0975-5861

e-ISSN 2249-4596

Version of record

v1.2

Issue date

September 18, 2012

Language
en
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Detection of Microstructure of Roughness by Optical Method

Dr. R. Daira
Dr. R. Daira Physico Chemistry of Surfaces and interfaces Research Laboratory of Skikda (LRPCSI), Algeria.
V.Chalvedin
V.Chalvedin

Research Journals