Generation and Recombination Processes in Disordered Semiconductor Structures with Deep Centers

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sergey_v._bulyarskiy
sergey_v._bulyarskiy
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Sergey V. Bulyarskiy
Sergey V. Bulyarskiy
1 Institute of Nanotechnology of Microelectronics

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Generation and Recombination Processes in Disordered Semiconductor  Structures with Deep Centers Banner
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The article represents the physical processes and mechanisms that accompany the work of the real p-n-junction in disordered semiconductor structures with deep centers. A model for the transfer of electrons and holes in disordered semiconductors has been developed and expressions for the recombination rate have been obtained, which take into account the exchange of charge carriers between neighboring localized regions. The probability of electronic transitions is calculated. It takes into account the electron-phonon interaction and explains the rapid build-up of reverse currents as the applied voltage increases. The new model of recombination in space charge region of p-n-junction has been developed. This model made it possible to develop a new method for processing current-voltage characteristics and determining the parameters of recombination centers in semiconductor devices including electron-phonon interaction parameters.

28 Cites in Articles

References

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Funding

No external funding was declared for this work.

Conflict of Interest

The authors declare no conflict of interest.

Ethical Approval

No ethics committee approval was required for this article type.

Data Availability

Not applicable for this article.

sergey_v._bulyarskiy. 2020. \u201cGeneration and Recombination Processes in Disordered Semiconductor Structures with Deep Centers\u201d. Global Journal of Science Frontier Research - A: Physics & Space Science GJSFR-A Volume 20 (GJSFR Volume 20 Issue A13): .

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GJSFR Volume 20 Issue A13
Pg. 17- 39
Journal Specifications

Crossref Journal DOI 10.17406/GJSFR

Print ISSN 0975-5896

e-ISSN 2249-4626

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GJSFR-A Classification: FOR Code: 091306
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v1.2

Issue date

December 14, 2020

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English

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The article represents the physical processes and mechanisms that accompany the work of the real p-n-junction in disordered semiconductor structures with deep centers. A model for the transfer of electrons and holes in disordered semiconductors has been developed and expressions for the recombination rate have been obtained, which take into account the exchange of charge carriers between neighboring localized regions. The probability of electronic transitions is calculated. It takes into account the electron-phonon interaction and explains the rapid build-up of reverse currents as the applied voltage increases. The new model of recombination in space charge region of p-n-junction has been developed. This model made it possible to develop a new method for processing current-voltage characteristics and determining the parameters of recombination centers in semiconductor devices including electron-phonon interaction parameters.

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Generation and Recombination Processes in Disordered Semiconductor Structures with Deep Centers

Sergey V. Bulyarskiy
Sergey V. Bulyarskiy

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