New Spectro-Electrochemical Setup for Determining the Rate Change of Oxide Film Growth of Aluminum by White Light-Optical Interferometry

1
Khaled Habib
Khaled Habib
2
Waleed Mohammad
Waleed Mohammad
3
Farzia Karim
Farzia Karim
4
Joydeep Dutta
Joydeep Dutta
5
Partha Banerjee
Partha Banerjee

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GJSFR Volume 22 Issue A5

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New Spectro-Electrochemical Setup for Determining the Rate Change of Oxide Film Growth  of Aluminum by White Light-Optical Interferometry Banner
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White light interferometry was applied to obtain the rate change of an oxide film growth of aluminum samples during the anodization in aqueous solutions. The thickness (d) of the oxide film was determined by Fabry-Perot, i.e., white light, interferometry. In other words, for the first time, an electromagnetic, i.e., Fabry-Perot, method was utilized to obtain the rate change of the oxide film growth of aluminum samples rather than the electronic, i.e., direct current (DC) or alternating current (AC), methods, as a function of the time (t) of the anodization processes. Therefore, the abrupt rate change of the d(d)/dt was called anodization-emission spectroscopy. The anodization process of the aluminum samples was carried out by the DC method in different sulphuric acid concentrations (0.0,2,4,6,8,10% H2SO4) at room temperature. In the meantime, the Fabry-Perot interferometry was used to determine the difference between d of two subsequent values, d(d), as a function of the elapsed time, dt, of the DC experiment for the aluminum samples in H2SO4 solutions. The Fabry-Perot interferometry was based on a fiberoptic sensor to make real time-white light interferometry possible at the aluminum surfaces in the acid solutions.

Funding

No external funding was declared for this work.

Conflict of Interest

The authors declare no conflict of interest.

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No ethics committee approval was required for this article type.

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Not applicable for this article.

Khaled Habib. 2026. \u201cNew Spectro-Electrochemical Setup for Determining the Rate Change of Oxide Film Growth of Aluminum by White Light-Optical Interferometry\u201d. Global Journal of Science Frontier Research - A: Physics & Space Science GJSFR-A Volume 22 (GJSFR Volume 22 Issue A5): .

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High-precision analysis of aluminum oxide growth rates.
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GJSFR Volume 22 Issue A5
Pg. 61- 67
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Crossref Journal DOI 10.17406/GJSFR

Print ISSN 0975-5896

e-ISSN 2249-4626

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GJSFR-A Classification: DDC Code: 791.4309 LCC Code: PN1993.5.A1
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September 23, 2022

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English

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White light interferometry was applied to obtain the rate change of an oxide film growth of aluminum samples during the anodization in aqueous solutions. The thickness (d) of the oxide film was determined by Fabry-Perot, i.e., white light, interferometry. In other words, for the first time, an electromagnetic, i.e., Fabry-Perot, method was utilized to obtain the rate change of the oxide film growth of aluminum samples rather than the electronic, i.e., direct current (DC) or alternating current (AC), methods, as a function of the time (t) of the anodization processes. Therefore, the abrupt rate change of the d(d)/dt was called anodization-emission spectroscopy. The anodization process of the aluminum samples was carried out by the DC method in different sulphuric acid concentrations (0.0,2,4,6,8,10% H2SO4) at room temperature. In the meantime, the Fabry-Perot interferometry was used to determine the difference between d of two subsequent values, d(d), as a function of the elapsed time, dt, of the DC experiment for the aluminum samples in H2SO4 solutions. The Fabry-Perot interferometry was based on a fiberoptic sensor to make real time-white light interferometry possible at the aluminum surfaces in the acid solutions.

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New Spectro-Electrochemical Setup for Determining the Rate Change of Oxide Film Growth of Aluminum by White Light-Optical Interferometry

Khaled Habib
Khaled Habib
Waleed Mohammad
Waleed Mohammad
Farzia Karim
Farzia Karim
Joydeep Dutta
Joydeep Dutta
Partha Banerjee
Partha Banerjee

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