RCD Nuisance Tripping: Whoas Guilty and what Needs to be Done?

RCD Nuisance Tripping: Whoas Guilty and what Needs to be Done?

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Vladimir Gurevich

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RCD Nuisance Tripping: Whoas Guilty and what Needs to be Done?

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Abstract

The reasons for nuisance tripping of residual current devices (RCD) are analyzed in the article and the affect of many external factors is discussed. Solutions are described for avoiding faulty tripping of an RCD.

References

7 Cites in Article

Reference Format

(null). Referencias.
Low-voltage electrical installation -Part 4-41.
(null). Low-voltage electrical installations.
S Czapp (2008). The Effect of Earth Fault Current Harmonics on Tripping of Residual Current Devices.
S Czapp (2007). Analysis of the Residual Current Devices Independent Trip for the Residual Current Frequency Higher than Rated Value. -XIII International Scientific Conference.
Stanislaw Czapp (2008). The impact of higher-order harmonics on tripping of residual current devices.
Yu Xiang,V Cuk,J Cobben Impact of Residual Harmonic Current on Operation of Residual Current Devices.

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Funding

No external funding was declared for this work.

Conflict of Interest

The authors declare no conflict of interest.

Ethical Approval

No ethics committee approval was required for this article type.

Data Availability

Not applicable for this article.

How to Cite This Article

. 2013. \u201cRCD Nuisance Tripping: Whoas Guilty and what Needs to be Done?\u201d. Global Journal of Research in Engineering - F: Electrical & Electronic GJRE-F Volume 13 (GJRE Volume 13 Issue F11): .

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GJRE Volume 13 Issue F11
Pg. 31- 40

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Journal Specifications

Crossref Journal DOI 10.17406/gjre

Print ISSN 0975-5861

e-ISSN 2249-4596

Keywords

differential current harmonic leakage current nuisance tripping RCD residual current device

Submission ReceivedDecember 6, 2012
Peer Review Double Blind
Handling Editor
Accepted December 31, 2012
Published January 15, 2013

Version of record

v1.2

Issue date

September 20, 2013

Language

en

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Article Matrices

Total Score: 101

Country: Unknown

Subject: Global Journal of Research in Engineering - F: Electrical & Electronic

Authors: Vladimir Gurevich (PhD/Dr. count: 0)

View Count (all-time): 174

Total Views (Real + Logic): 4885

Total Downloads (simulated): 2395

Publish Date: 2013 09, Fri

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Total Views: 4885

Total Downloads: 2395

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Published Article

The reasons for nuisance tripping of residual current devices (RCD) are analyzed in the article and the affect of many external factors is discussed. Solutions are described for avoiding faulty tripping of an RCD.

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