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L1257
The reasons for nuisance tripping of residual current devices (RCD) are analyzed in the article and the affect of many external factors is discussed. Solutions are described for avoiding faulty tripping of an RCD.
. 2013. \u201cRCD Nuisance Tripping: Whoas Guilty and what Needs to be Done?\u201d. Global Journal of Research in Engineering - F: Electrical & Electronic GJRE-F Volume 13 (GJRE Volume 13 Issue F11).
Crossref Journal DOI 10.17406/gjre
Print ISSN 0975-5861
e-ISSN 2249-4596
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Total Score: 101
Country: Unknown
Subject: Global Journal of Research in Engineering - F: Electrical & Electronic
Authors: Vladimir Gurevich (PhD/Dr. count: 0)
View Count (all-time): 182
Total Views (Real + Logic): 4924
Total Downloads (simulated): 2481
Publish Date: 2013 09, Fri
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This study aims to comprehensively analyse the complex interplay between
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