Neural Networks and Rules-based Systems used to Find Rational and Scientific Correlations between being Here and Now with Afterlife Conditions
Neural Networks and Rules-based Systems used to Find Rational and
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It is of great practical significance to test and analyze the quality of silicon materials used in integrated devices and their changes in planar thermal process. This paper summarizes the international test, analysis and research results. The contents include polycrystal preparation, single crystal growth and its crystal defects, wafer cutting, grinding and polishing, wafer tracking observation and analysis in plane thermal process, generation control and elimination of induced dislocations, etc.
Chuan-Zheng Yang. 2026. \u201cTest and Research of Silicon Materials in Integrated device Engineering\u201d. Global Journal of Science Frontier Research - A: Physics & Space Science GJSFR-A Volume 23 (GJSFR Volume 23 Issue A4): .
Crossref Journal DOI 10.17406/GJSFR
Print ISSN 0975-5896
e-ISSN 2249-4626
The methods for personal identification and authentication are no exception.
The methods for personal identification and authentication are no exception.
Total Score: 131
Country: China
Subject: Global Journal of Science Frontier Research - A: Physics & Space Science
Authors: Chuan-Zheng Yang (PhD/Dr. count: 0)
View Count (all-time): 187
Total Views (Real + Logic): 1181
Total Downloads (simulated): 18
Publish Date: 2026 01, Fri
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It is of great practical significance to test and analyze the quality of silicon materials used in integrated devices and their changes in planar thermal process. This paper summarizes the international test, analysis and research results. The contents include polycrystal preparation, single crystal growth and its crystal defects, wafer cutting, grinding and polishing, wafer tracking observation and analysis in plane thermal process, generation control and elimination of induced dislocations, etc.
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