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In this paper the performance of the ball grid array (BGA) electronic packaging is investigated. The fields of temperature and stress are analyzed for the overall model &for solder balls by finite element method (FEM) usingCOMSOL Multiphysics 5.2a soft ware to analyze different aspects to improve the reliability & efficiency of integrated chip. The simulation result shows that the maximum value of temperature and thermal stress are 41 degree Celsius &199MParespectively.The maximum temperature is obtained on the chip surface and the maximum stress happens on the outside corner of the ball joints. The range analysis shows that the maximum stress increases with the increase of chip thickness, substrate width, ball pitch, CTE but the value of maximum stress decrease with the increase of ball diameter and Poissonβs ratio.
Tasneem Shifa, Dr. Hossain. 2018. "Thermal Stress Analysis of BGA Packaging Structure". Global Journal of Research in Engineering, Global Journal of Research in Engineering - F: Electrical & Electronic GJRE-F Volume 18 (GJRE Volume 18 Issue F3).
Crossref Journal DOI 10.17406/gjre
Print ISSN 0975-5861
e-ISSN 2249-4596
v1.2
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Total Score: 107
Country: Bangladesh
Subject: Global Journal of Research in Engineering
Authors: Tasneem Khan Shifa, Dr. Md. Faruque Hossain (PhD/Dr. count: 1)
View Count (all-time): 339
Total Views (Real + Logic): 1219
Total Downloads (simulated): 92
Publish Date: 2018 01, Mon
Monthly Totals (Real + Logic):
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